MIL-STD-750 establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems.  The methods and procedures in the various parts of this standard cover basic environmental, physical and electrical tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations.  For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts.  This standard is intended to apply only to semiconductor devices.  The test methods and procedures described in the various parts of this multipart test method standard have been prepared to serve several purposes.